Ordering at Surfaces and Interfaces: Proceedings of the by J. F. van der Veen, R. G. van Silfhout, A. W. Denier van der

By J. F. van der Veen, R. G. van Silfhout, A. W. Denier van der Gon (auth.), Professor Akio Yoshimori, Professor Teruya Shinjo, Dr. Hisatsune Watanabe (eds.)

This quantity comprises the court cases of the 3rd in a sequence of biennial NEC Symposia on basic techniques to New fabric levels subsidized by way of the NEC company, Tokyo, Japan. The symposium was once held from October 7 to eleven, 1990, on the Hakone Kanko H9tel in Hakone. approximately forty invited individuals stayed jointly, turned desirous about extreme discussions, and freely exchanged rules either out and in of the convention room, which confronted Mt. Fuji, the gorgeous lake Ashinoko, and the quiet panorama within the outdated crater. The name of this quantity, Ordering at Surfaces and Interfaces, which used to be additionally the identify of the 3rd symposium, describes the purpose of the symposium: to debate ordering homes and their underlying mechanisms at surfaces and interfaces. the subjects handled comprise the reconstruction of surfaces of semiconductors and metals, atomic and magnetic ordering at interfaces, theoretical instruments to check or­ dering mechanisms at surfaces and interfaces, ordering in adsorbate-surface sys­ tems, comparable to alkali-adsorbed silicon surfaces, electrical present results on semicon­ ductor surfaces and lots of comparable STM (scanning tunneling microscopy) results.

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Extra resources for Ordering at Surfaces and Interfaces: Proceedings of the Third NEC Symposium Hakone, Japan, October 7–11, 1990

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Lower ion doses. The larger holes most likely were created relatively early and experienced a larger ion exposure than smaller craters. In addition, the bright lines showing the surface reconstruction are seen to be wiggly, rather than straight as for well ordered surfaces. Unsputtered surfaces often have complicated domain structures exhibiting numerous 120 0 kinks. In contrast, sputtered surfaces show significantly more forked reconstruction lines, located at craters. This observation is consistent with a possible impact-induced reordering of the reconstruction.

Sakai, Y. Kobayashi, S. Watanabe, and F. Matsumoto, Bulletin of the Electrotechnical Laboratory 54, 136 (1990). 10. K. Takayanagi, Y. Tanishiro, M. Takahashi and S. Takahashi, Surf. Sci. 164,367 (1985). 11. T. Sakamoto, NJ. Kawai, T. Nakagawa, K. Ohta, and T. Kojima, Appl. Phys. Lett. 47, 617 (1985). 12. N. Osakabe, K. Yagi and G. Honjo, Jpn. J. Appl. Phys. 19, L309 (1980). 13. V. L. B. L Stenin, Surf. Sci. 213, 157 (1987). 14. M. Henzler, Surf. Sci. 19, 159 (1970); ibid. 36, 109 (1973). 15. C.

A field emission gun is required. due to the necessity of large spatial coherence of an electron beam for hologram formation. 4. Electrons at a divergent angle of less than 1x10rad illuminate the specimen. The specimen is located in one half of the specimen plane. The other half is for a reference electron beam whose wavefront is not disturbed by the specimen. An image of the specimen is formed through the objective lens. The electron biprism is installed below the objective lens. 3 pm diameter wire and two ground potential electrodes on both sides.

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